Blink and you miss it
19 December 2019
Greg Blackman explores the cameras used to capture extremely rapid events
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Kaya Instruments
MVDK evaluation board with MIPI CSI-2 sensor and CXP interface board. Credit: Euresys
Lowering development effort with IP cores
7 November 2019
Greg Blackman finds that purchasing IP cores for FPGAs is one way to reduce time-to-market for camera production
Predator2
15 October 2018
The Predator2 is a low-cost frame grabber supporting the new CoaXPress 2.0 standard
CoaXPress IP Core with Intel Arria 10 FPGA support
23 January 2018
Kaya Instruments has announced that its CoaXPress IP Core already supports the Intel Arria 10 FPGAs
KY-FGK-801 frame grabber compatible with the VC-12MX2 camera
23 October 2017
Kaya Instruments and Vieworks announce that, the Komodo 8-channel CoaXPress frame grabber, KY-FGK-801 by Kaya Instruments, is fully compatible with the VC-12MX2 8-channel CoaXPress high-speed CMOS camera by Vieworks
JetCam
20 December 2016
Kaya Instruments has announced a new generation of high speed cameras for machine vision and slow motion
Events
Latest issue
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
