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Czech start-up, Pekat, has developed machine learning and deep learning algorithms to automate processes in manufacturing, transport, and logistics
Datalogic has released the P2X smart camera series
Michele Leoni, senior product manager, machine vision at Datalogic, discusses product traceability for the next generation of factories
Datalogic has launched Impact+ OCR, the smartest solution for variable data printing inspection in the Food & Beverage industry
Datalogic has released the Matrix 210N, an ultra-compact 2D imager
Datalogic has announced the release of the new Matrix N Line powered by state-of-the-art configuration software, DL.CODE.
Datalogic has released the P-Series smart camera for machine vision applications in food and beverage, pharmaceutical and automotive industries
After more than four decades in the vision business, Datalogic products are in use all around the globe. Tim Gillett reports
Datalogic has released Impact 11.2, a machine vision software package supporting the latest smart cameras and vision processors
Datalogic Automation has introduced its A- and T-series smart cameras designed for quick and compact integration of machine vision applications
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
