Semiconductor inspection

Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.

The latest SWIR tech for inspecting semiconductor wafers

Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology

The new camera is easily configurable and could have applications in analysing combustion phenomena, detecting hazardous gases and characterising semiconductor materials (Image: INRS)

Ultrafast single-pixel camera to unlock applications in non-visible spectrum

The new camera is easily configurable and could have applications in analysing combustion phenomena, detecting hazardous gases and characterising semiconductor materials

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