The ATX650G camera is designed for applications that require high bandwidth and low latency.
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
The camera opens a world of industrial applications with greater precision in fruit inspection and sorting, packaging, IR microscopy, semiconductor inspection, material sorting and more
The camera achieves a resolution of 8.1MP and offers global shutter, progressive scan technology to enables real time, lag-free images at 15Hz full-frame
The new camera is easily configurable and could have applications in analysing combustion phenomena, detecting hazardous gases and characterising semiconductor materials (Image: INRS)
The new camera is easily configurable and could have applications in analysing combustion phenomena, detecting hazardous gases and characterising semiconductor materials
The ATX081S-UC 10GigE PoE+ UV camera equipped with the high UV sensitivity 8.1 MP Sony IMX487 global shutter CMOS sensor, is capable of capturing images across the ultraviolet light spectrum in the 200 to 400nm range
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
