Vulkan Safety-Critical 1.0 API specification enables safety-critical industries to deploy GPU graphics and compute acceleration while meeting high levels of functional safety requirements
Image: Martial Red/shutterstock.com
Khronos and EMVA have formed a working group to develop an open API standard for camera control to improve interoperability
Neil Trevett and Chris Yates
The Khronos Group and the EMVA are to explore software standards for embedded vision. Khronos’ Neil Trevett and EMVA’s Chris Yates explain the work
Participants in the Embedded Camera API Exploratory Group will discuss requirements for new interoperability standards to accelerate market growth and reduce development costs
Khronos will host a free OpenVX webinar that will:
Prior to speaking at the Embedded World trade fair, The Khronos Group’s president, Neil Trevett, discusses the open API standards available for applications using machine learning and embedded vision
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
