The Austrian Institute of Technology's 3D surface scanner. Credit: AIT Austrian Institute of Technology
The Austrian Institute of Technology, HD Vision Systems, Prophesee and Zeiss have been recognised by the judges, with the award to be presented at Vision in Stuttgart
The Moon landing was 50 years old in 2019. Zeiss lenses were used to capture this image
The last year has been one of consolidation for the machine vision industry, along with a slowdown in the markets that machine vision serves
Astronaut Edwin Aldrin Jr., lunar module pilot, walks on the surface of the Moon. Astronaut Neil Armstrong, commander, took this photograph with a 70mm lunar surface camera. Credit: NASA
On the 50th anniversary of the Moon landing on 20 July 1969, Zeiss has described how, in less than nine months, it built the camera lens used to capture the iconic images during the Apollo 11 mission
Zeiss's Smartzoom 5 digital microscope can remove glare from images by using angular illumination
Reporting from the EMVA’s business conference in Copenhagen, Greg Blackman discovers how angular illumination and computational imaging can dramatically improve the resolution of a system
Gom’s technology, which includes non-contact 3D sensors and scanners for surface metrology, will now be part of Zeiss’s industrial metrology and quality assurance portfolio
Greg Blackman reports from the European Machine Vision Association’s business conference, where a panel of industry experts were gathered to give advice on navigating the acquisition process
With the Greek economic crisis providing the backdrop, Greg Blackman reports from the European Machine Vision Association's business conference in Athens
With ZEISS PiWeb, ZEISS has now enhanced its software for quality data management
The new Zeiss industrial lenses with an M42 thread mount feature a compact size, good image quality and a robust, all-metal body
Zeiss presented an automated digital microscope, the Smartzoom 5, at the trade show Control from 6-9 May
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
