Architector Vision Suite 1.8.0
21 July 2011
Quest Innovations has released an improved edition of Architector Vision Suite (1.8.0)
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Quest Innovations
Multispectral cameras with M42 lens mount
9 May 2011
Five channel multispectral cameras from Quest Innovations are now available with an M42 lens mount interface
Spectroscopy meets imaging
15 February 2011
Multispectral and hyperspectral imaging techniques, which combine spectroscopy and imaging, are opening up a range of applications from environmental monitoring and agricultural research to automation of plastic recycling, as Greg Blackman discovers
Condor-1000 MS5 285
5 January 2011
Quest Innovations has released the Condor-1000 MS5 285. The model is a 2/3-inch prism camera based on the Sony ICX285 sensor, an interline CCD solid-state image sensor with a square pixel array
Condor-1000 MS1-FV
13 December 2010
Quest Innovations has released the Condor-1000 MS1-FV. Specific selected customers have been testing this Foveon based camera with good results
Condor-1000 MS3-RGB120
13 December 2010
Quest Innovations has released the Condor-1000 MS3-RGB120 as its sixth addition to the Condor1000 multispectral camera range
Events
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A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
