FEI has introduced two DualBeam focused ion beam (FIB), scanning electron microscopy (SEM) systems, ideal for materials research applications
FEI has released a suite of solutions for correlative light and electron microscopy
FEI has released the Helios NanoLab 450 F1 DualBeam electron microscope, designed to provide semiconductor manufacturers with faster, better images of advanced device architectures
Instrumentation company FEI has added a UniColore (UC) monochromated electron source to its Versa 3D DualBeam system
Image credit: Fit Ztudio/Shutterstock.com
Deep learning has helped to make great strides in machine vision technology, but there are additional data-centric tools that can help new applications come to life. Find out more...
CCD374 for Sentinel-4 Earth observation satellite. Credit: ESA
The different requirements of industrial and space imaging have led to distinct sensor development paths that diverge and intersect in interesting ways, as Benjamin Skuse finds out
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Clever manipulation of light is allowing researchers to image deeper into tissue to ultimately further our understanding of the brain. Abigail Williams investigates
One of SweGreen's eight vertical farm units that it operates across Sweden. Credit: SweGreen
Automation, lighting regimes, and hyperspectral imaging are unlocking vertical farming’s full potential, finds Benjamin Skuse
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There’s a renaissance underway in shortwave infrared imaging as thin-film photodetectors come online. Tim Hayes reports
