FEI has introduced two DualBeam focused ion beam (FIB), scanning electron microscopy (SEM) systems, ideal for materials research applications
FEI has released a suite of solutions for correlative light and electron microscopy
FEI has released the Helios NanoLab 450 F1 DualBeam electron microscope, designed to provide semiconductor manufacturers with faster, better images of advanced device architectures
Instrumentation company FEI has added a UniColore (UC) monochromated electron source to its Versa 3D DualBeam system
Limited data is a common problem when training CNNs in industrial imaging applications. Petra Thanner and Daniel Soukup, from the Austrian Institute of Technology, discuss ways of working with CNNs when data is scarce
Matthew Dale explores the high-resolution imaging solutions emerging for inspecting OLEDs and other electronic displays
As car makers install production lines for electric vehicles, Greg Blackman looks at how vision is currently used in their factories
Keely Portway investigates how vision technology is being used in the dental sector, from initial diagnosis, to quality control of prostheses
The UK is up to 20 per cent less productive than its major competitor countries because it is not investing in automation, Mike Wilson at the British Automation and Robot Association said at UKIVA's machine vision conference in Milton Keynes. Greg Blackman reports
