FEI has introduced two DualBeam focused ion beam (FIB), scanning electron microscopy (SEM) systems, ideal for materials research applications
FEI has released a suite of solutions for correlative light and electron microscopy
FEI has released the Helios NanoLab 450 F1 DualBeam electron microscope, designed to provide semiconductor manufacturers with faster, better images of advanced device architectures
Instrumentation company FEI has added a UniColore (UC) monochromated electron source to its Versa 3D DualBeam system
MVTec’s deep learning tool provides means to label data simply and efficiently
Matthew Dale explores the software to simplify the management and labelling of deep learning data
Classification of nuts as good or bad using Specim’s FX17 camera
Optical design is crucial in enabling wider adoption of hyperspectral imaging, finds Andy Extance
Keely Portway surveys the latest advances in colour imaging, creating fresh opportunities in certain applications
An Illustration of the surface of PAN fibres (left) and carbon fibres after spreading (right). Credit: Fraunhofer IGCV and Chromasens
Work is underway to build a vision system to detect defects in webs of composite materials
