How to combine machine vision with a digital twin and SLM for industrial process control
Dr Euan Smith (left) is Head of System and Photonics and a managing consultant at 42T, and Pete Alexander (right) is an Embedded Systems Engineer and electronics and software consultant (Image: 42T)
42 Technology’s Euan Smith and Pete Alexander explain how to turn inspection data into actionable industrial insight

Register for FREE to keep reading
Join 10,000+ vision professionals driving innovation in automation, AI and imaging with:
- Expert insights on vision, robotics, AI & embedded tech
- Newsletters and features covering the full imaging landscape
- Visionaries series: leadership strategies in imaging
- Free panels on smart manufacturing & autonomy
- White Papers & updates for smarter integration
Sign up now
Already a member? Log in here
Your data is protected under our privacy policy.