Micro-LED PL inspection system

Hamamatsu Photonics has developed a system for high-speed inspection of micro-LEDs on wafers to detect abnormalities in their external appearance, intensity and wavelength of their light emissions

Dragonfly G3 inspection platform

Onto Innovation has announced the availability of its Dragonfly G3 inspection platform, designed to meet 2D and 3D sensitivity requirements for electronic packaging manufacturers

Perfect pixels

Matthew Dale explores the high-resolution imaging solutions emerging for inspecting OLEDs and other electronic displays


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