Thanks for visiting Imaging and Machine Vision Europe.

You're trying to access an editorial feature that is only available to logged in, registered users of Imaging and Machine Vision Europe. Registering is completely free, so why not sign up with us?

By registering, as well as being able to browse all content on the site without further interruption, you'll also have the option to receive our magazine (multiple times a year) and our email newsletters.

IR-1000 camera

Share this on social media:

Dage-MTI, a US-based manufacturer of cameras for bioscience, inspection and analysis, has introduced a near-infrared (NIR) camera for applications that require high sensitivity in the NIR wavelength range. The IR-1000 offers two important features: automatic contrast and real-time edge enhancement.

To provide optimum contrast, the real-time CCD camera includes electronics that will automatically and instantaneously readjust when a scene changes. This design is especially useful when changing magnification levels, specimens, and/or lighting levels. For added flexibility, the user has continuous access to the manual gain and may also engage the camera’s black-level control to achieve specific greyscale contrast.

The camera’s real-time edge enhancement feature sharpens the edges and delivers a clearer picture by resolving fine details in the image. With enhanced sensitivity across the visible and infrared spectral wavelength, the 1/2-inch sensor features a 5x increase in sensitivity at 900nm. With the enhanced sensitivity, the camera can detect cells in low light conditions; the extended IR response allows deeper penetration into tissue sections (e.g. brain slices) for further analysis. The high gain of the camera enables the user to detect images in real-time (30fps) even when energy levels are low.

With a convenient C-mount, the IR-1000 is widely used in ‘live’ mode, connected directly to a monitor. An optional computer interface board is also available. Dage-MTI’s real-time camera is ideal for applications such as electrophysiology, infrared differential interference contrast (IR-DIC), failure analysis, forensics and semiconductor inspection.