Infrared camera with microscope optics

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High-precision result images, micro-precise detection options, detailed analysis capability: Specially developed for use in non-destructive testing, the infrared camera with microscope optics from AT - Automation Technology offers numerous advantages when it comes to inspecting the smallest components. Probably the most popular application for the camera is the inspection of electronic components. Since these are often so tiny that normal infrared cameras reach their limits in terms of resolution, the infrared camera with microscope optics from AT is the optimal solution for reliably checking the functionality of the mini object to be inspected and thus for quality control.

AT - Automation Technology has developed a very customer-friendly tool regarding the infrared camera with microscope optics, since detailed analyses in the micrometer range can usually only be carried out with cooled infrared cameras, which are very expensive and require a lot of maintenance. The AT solution, on the other hand, is cost-effective, maintenance-free and, at the same time, of particularly high quality and technology. With the help of the microscope optics, a resolution of up to 10 micrometers is possible at a distance of 12 millimeters from the object.

The very compact dimensions of the camera-optics combination should also be emphasized, and the camera can also be used in harsh environments in a temperature range from -35° to +55° without any problems.

Image: Sonpichit Salangsing/shutterstock.com

09 November 2021

Paweł Malinowski, program manager at Imec

15 December 2021

Paweł Malinowski, program manager at Imec

15 December 2021

Images taken with STMicroelectronics' 940nm NIR Quantum Film sensor (top left) and with its 1,400nm SWIR QF sensor (bottom left). Corresponding images taken using a visible smartphone camera (right). The QF NIR image shows better contrast between black electrical wires hidden in the dark green leaves, and tree trunks and branches hidden in front of the dark wood fence. The SWIR QF image shows how effective it is to use SWIR imaging to see through a silicon wafer. Credit: STMicroelectronics

15 December 2021

Image: Sonpichit Salangsing/shutterstock.com

09 November 2021

Image: Valery Lisin/shutterstock.com

28 October 2021