Embedded Vision Europe conference to cover AI topics in Stuttgart

Share this on social media:

From 24 to 25 October, the ICS International Congress Center Stuttgart will once again be the European focus of the embedded vision scene. For two days, the Embedded Vision Europe 2019 (eVe) conference will focus on all aspects of this disruptive technology. The conference attendees can expect an extensive range of top-notch lectures, a well-chosen selection of embedded vision solutions in the accompanying table-top exhibition and ample of time for selected networking activities.

Opening Keynote from Intel

A highlight of the conference will certainly be the opening keynote by David Austin, Sr Principal Engineer at Intel Corporation and responsible for AI-based solutions for the industrial IoT market on the topic 'Flexible and Practical AI for Industrial Deployment'. In his speech David will present concrete steps for practical implementation options to optimize key performance metrics such as accuracy, latency and cost in the industrial use of Artificial Intelligence. He aims to enable the audience to transform the acquired knowledge directly into practice in their own IIoT projects.

The lecture by Jagan Ayyaswami from Micron Technology deals with processor architectures for machine learning. The following presentation by Ratislav Struharik from IDS titled "Universal CNN Accelerator intended for edge-base AI inference" is part of the same topic. Neil Trevett, Vice President Developer Ecosystems at NVIDIA and President of the Khronos Consortium, will give a speech on "APIs for Accelerating Vision and Inferencing: an Industry Overview of Options and Trade-offs". Andrea Dunbar, Head of Embedded Vision Systems at CSEM joins the speaker list on the first conference day with her talk on 'Autonomous data-logger with ULP imager'; as well as Michael Engel. The founder and president of Vision Components introduces 'MIPI Cameras: New Standard for Embedded Vision'.

Second conference day with Deep Learning as one of the main topics

At the beginning of the second day of the conference Jonathan Hou, Chief Technology Officer at Pleora, in his lecture 'Embedded Learning and the Evolution of Machine Vision' looks at the rapid development of image processing in recent years. "Using Sparse Modeling in Visual Inspection to Solve Issues Deep Learning Can't" is the topic of the talk given by Takashi Someda, Chief Technology Officer at Hacarus. Dr. Vassilis Tsagaris, CEO of IRIDA Labs, will look beyond the existing deep learning models and talk about 'A holistic embedded vision approach: looking beyond the deep learning models'. Pierre Gutierrez, Lead machine learning researcher at Scortex talks about 'The challenges of deploying Deep Learning for visual quality inspection'. Gion-Pitschen Gross, Product Manager at Allied Vision, addresses the practical implementation topics in his presentation "How to set up an embedded system for industrial embedded vision - Requirements, components, and solutions". The final presentation on the second conference day will be given by Bram Senave, Business Development Manager at Easics, on the user-oriented topic of "Embedded deep learning in PCB inspection".

The lecture program of the eVe Conference 2019 will be framed by a table-top exhibition as well as individually bookable B2B meetings during the conference breaks.

The inspection engineer is able to see on the tablet that the structure is free of defects (Credit: Fraunhofer)

14 February 2023

Stephen Su shares how Arm’s Cortex-M85 processor and software ecosystem can be leveraged to overcome the constraints of microcontroller unit platforms

16 March 2023

Stephen Su shares how Arm’s Cortex-M85 processor and software ecosystem can be leveraged to overcome the constraints of microcontroller unit platforms

16 March 2023

Maharajan Veerabahu, co-founder at E-Con Systems, shares the industries in which embedded vision and AI integration shows great promise

15 March 2023

The funding will support Lumai in building and launching optical networks for next-generation artificial intelligence models

17 February 2023

The label-free and automatable method will enable therapies to be tailored to individual patients (Image: Gerwert et al./European Journal of Cancer)

16 February 2023