Cameras used to detect source of laser beam aircraft attacks
Andor cameras help detect the source of laser beam attacks on aircraft
Andor cameras help detect the source of laser beam attacks on aircraft
Dragonfly was recognised by the R&D 100 Awards as one of the most Technologically Significant New Analytical Products of the year
Andor, an Oxford Instruments company, is pleased to announce the launch of Dragonfly 200, the latest model of its innovative high-speed confocal imaging platform
The launch of the Andor iKon-XL Very Large Area (VLA) Astronomy CCD and its successful placement on a new planetary transit survey telescope on the Antarctic Plateau raises the prospect of more breakthroughs to come
A set of 13 sixteenth century Italian wind instruments has been restored to working condition by Swiss experts using 3D X-ray imaging
Andor Technology announced the launch of a new super-resolution microscopy technology, available on single photon sensitive iXon EMCCD cameras
Andor Technology will be showcasing the iStar sCMOS, an ultrafast platform for nanosecond time-resolved imaging and spectroscopy
Andor Technology has launched the ultrasensitive iXon Life Electron Multiplying CCD camera platform, exclusively for fluorescence microscopy
Andor Technology announced the launch of an ultrafast Spectroscopy Mode on its high speed and low noise Zyla and iStar scientific CMOS (sCMOS) platforms
Greg Blackman investigates the imaging techniques used for high-throughput cellular imaging and super resolution microscopy
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology