Optical neural network streamlines sensor design
The ONN could lead to the development of faster, smaller and more energy-efficient image sensors.
The ONN could lead to the development of faster, smaller and more energy-efficient image sensors.
SynSense's Speck SoC has been integrated with a robot capable of visual perception, human body recognition, and mimicry.
The compact, low-power Swift-El detector could be a 'revolutionary' addition to the defence and industrial sectors
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
The money will be used to accelerate the mass-production of the firm’s Speck smart vision sensor, with an integrated neuromorphic AI processor
Prophesee's event-based Metavision sensors are being optimised for use with Qualcomm’s Snapdragon mobile platforms
Advances in sensors that capture images like real eyes, plus in the software and hardware to process them, are bringing a paradigm shift in imaging, finds Andrei Mihai
Visometry’s Twyn software is an AR platform for quality inspection; users annotate a CAD model against which the real part is compared
The investment makes the firm the EU’s most well-funded fabless semiconductor startup, having raised a total of $127m since its founding in 2014
Prophesee has announced the availability of an evaluation kit for developers who want to evaluate the new Sony IMX636ES HD event-based vision sensor
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology