Capture technology using multiple states of polarisation

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Polar I is developing a capture technology that is capable of detecting defects down to 40µm using multiple states of polarisation.

Our advanced imaging algorithm manipulates angles of polarization to produce x, y and z surface normals for ultra-high resolution 2D images and 3D point clouds.

When there is a crack, bulge, depression in a homogenous surface, it reflects the polarized light differently than its surroundings. Surface defects in metal/alloy/ceramic or painted surfaces need to be detected from a distance and under diverse lighting conditions. By acquiring polarimetric images of the surface for different angles of polarization and detect defects in polarimetric domain.

Degree and angle of polarization and surface normals will register an abrupt change in case of surface defects.

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