Veeco Instruments has released the Veeco Instruments Thermal Analysis (VITA) module for its line of Scanning Probe Microscopes (SPMs).
Matthew Dale explores Industry 4.0 and machine vision’s role in the connected factories of the future
Surface-based matching in Halcon, from MVTec Software
Greg Blackman looks at the latest techniques to capture and analyse 3D image data
Keely Portway finds out how vision is being used to gather data about consumers
The preferred connector for version 2.0 is the micro-BNC. Credit: Active Silicon
Chris Beynon, Active Silicon’s CTO and technical chair for the CoaXPress standard, gives an update on what’s new in v2.0
Greg Blackman reports on new hyperspectral technology presented at the Photonex show in the UK, and how the imaging technique is being used for forestry and food sorting
