Veeco Instruments has released the Veeco Instruments Thermal Analysis (VITA) module for its line of Scanning Probe Microscopes (SPMs).
VITA technology advances nanoscale material identification by providing characterisation capabilities through nanoscale thermal analysis (nTA), scanning thermal microscopy (SThM), and heated-tip AFM. Together these techniques enable the precise determination of local transition temperatures as well as mapping of temperature and thermal conductivity variations. The VITA accessory is compatible with Veeco’s Innova, Caliber, MultiMode, and Dimension systems.
