Lambert Instruments is proud to announce the next generation of its time-resolved intensified camera. The new TRiCAM is designed for scientific and industrial applications that require low-light imaging
Lambert Instruments has released a new range of high-speed cameras, the Lambert HS Series, offering simple and efficient high-speed imaging for scientific research, R&D, machine vision and other industrial applications
Lambert Instruments today announced the HiCAM Fluo: A high-speed camera for fluorescence applications
Lambert Instruments has introduced the LIFA-X, for long lifetime phosphorescence imaging, from 0.1ns up to 1ms (phosphorescence)
Lambert Instruments has extended its range of intensified high-speed cameras with the HiCAM 5000
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
