Mathias Bochow, GFZ Helmholtz Centre, Potsdam, is working on the Trace project to track marine plastic. Credit: Frank Schweikert, Aldebaran Marine Research & Broadcast (www.aldebaran.org/en/)
Abigail Williams speaks to scientists tracking marine plastic using satellite spectral imagery
Cubert extends its family of light field snapshot hyperspectral cameras with the Ultris 5
Classification of nuts as good or bad using Specim’s FX17 camera
Optical design is crucial in enabling wider adoption of hyperspectral imaging, finds Andy Extance
Cubert's Ultris 20 hyperspectral snapshot camera provides a more reliable alternative for aerial surveillance than conventional line scan cameras
Matthew Dale explores the emerging alternatives to push broom hyperspectral imaging
Greg Blackman reports on new hyperspectral technology presented at the Photonex show in the UK, and how the imaging technique is being used for forestry and food sorting
Cubert’s new Ultris camera was developed based on the light field technology. The camera features an Ultra-HD CMOS sensor with 20 megapixel, which makes Ultris the imaging spectrometer with the worldwide highest resolution
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
