Ceva announced from AutoSens in Brussels NeuPro-S, its second-generation AI processor architecture for deep neural network inferencing at the edge
Ceva has partnered with LG Electronics to deliver a high-performance, low-cost smart 3D camera solution for consumer electronics and robotic applications
CEVA and Evomotion Technology announced advanced imaging and computer vision features for Evomotion’s ROD-1/360°/720° dual-lens spherical camera
CEVA, Inc. (NASDAQ: CEVA), the leading licensor of signal processing IP for smarter, connected devices, today announced that Novatek Microelectronics has licensed and deployed the CEVA-XM4 intelligent vision DSP for its next-generation vision-enabled System.
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
