Fraunhofer scientist wins award for imaging characterisation of silicon

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Dr Martin Schubert of the Fraunhofer Institute for Solar Energy Systems ISE has been awarded the Ulrich Gösele Young Scientist Award 2013 for his research work on the measurement, simulation and origin of impurities in multicrystalline silicon.

The award ceremony took place on 23 October at the 7th International Conference on Crystalline Silicon for Solar Cells (CSSC-7) in Fukuoka, Japan.

Schubert’s research focuses on the development of luminescence-based characterisation methods, the simulation of impurities in silicon as well as cell characterisation through imaging. In particular, he is investigating the influence of metals on the solar cell efficiency.

‘We are very pleased that Dr Marin Schubert received this prestigious award. For many years, he has been working on the characterisation and quality assurance of silicon material, among other topics. His scientific work has made a major contribution to the research and development in this area,’ commented Dr Wilhelm Warta department head of Characterisation and Simulation at Fraunhofer ISE.

Schubert has been working at Fraunhofer ISE since 2004. He is currently the group leader of Material and Cell Analysis.

The Ulrich Gösele Young Scientist Award distinguishes scientific-technical contributions in the areas of silicon feedstock, crystal growth, wafer manufacturing and defect engineering.

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