SUI (Sensors Unlimited, Inc.) has introduced the new SU-LDH digital line scan SWIR Camera for spectroscopy and machine vision applications.
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
