Keyence has further extended its portfolio of precision measurement technologies with a new, high-accuracy image dimension measurement system.
Boasting accuracy to ±0.7μm, the LM Series combines the ease of use associated with the Keyence range with the breakthrough precision demanded across an ever broader range of applications.
Keyence has introduced a range of inline telecentric measurement systems with advanced silhouette-based analysis
Keyence will be introducing pattern projection lighting
Keyence will showcase its multi-spectrum lighting product
The latest microscope from KEYENCE revolutionises how imaging and analysis are performed. By integrating the most recent advancements in optical and digital technologies, the VHX-5000 Digital Microscope is able to instantly capture any area in complete fo
Keyence has released a new multi-purpose microscope
Keyence has released its latest microscope system, the VHX-2000. The VHX streamlines testing and improves the speed and efficiency of the inspection process
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
