When connected to a laser beam, the new thin-film circuit produces finely tailorable terahertz-frequency waves. The device opens up a world of potential applications in optics, imaging and telecommunications. (Image: EPFL)
The chips show promise for a whole host of applications in optics, spectroscopy, imaging and telecommunications
InGaAs and event-based sensors still rely on silicon CMOS readout ICs
Greg Blackman explores the work being done on InGaAs sensors, along with other types of novel sensor that could find their way into the machine vision market
Scientists at the Swiss technical university, EPFL, have combined hyperspectral imaging with metasurfaces – artificial materials covered in millions of nano-sized elements – to develop a label-free biosensing platform
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
