The sensors can withstand increased ambient temperatures up to 75ºC. Also they provide exceptionally low temperature drift of just 2% across the entire sensing range
Keyence has further extended its portfolio of precision measurement technologies with a new, high-accuracy image dimension measurement system.
Boasting accuracy to ±0.7μm, the LM Series combines the ease of use associated with the Keyence range with the breakthrough precision demanded across an ever broader range of applications.
The Austrian Institute of Technology's 3D surface scanner. Credit: AIT Austrian Institute of Technology
The Austrian Institute of Technology, HD Vision Systems, Prophesee and Zeiss have been recognised by the judges, with the award to be presented at Vision in Stuttgart
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
