Harald Wuest (centre) receiving the award from Anne Wendel, director of VMDA Machine Vision, and Messe Stuttgart's Florian Niethammer. Credit: Landesmesse Stuttgart GmbH
Visometry’s Twyn software is an AR platform for quality inspection; users annotate a CAD model against which the real part is compared
OmniVision Technologies has announced the OVM7251 CameraCubeChip global shutter sensor
Rob Ashwell finds that logistics, healthcare and research are turning to consumer imaging systems for their needs
Alpina Partners, an independent investment firm, has acquired a significant shareholding in Virtalis, a virtual reality (VR) provider that will become part of a larger group of software companies in Alpina’s portfolio
European scientists are developing an augmented reality surgical visor capable of superimposing a patient’s x-ray images and other medical information in perfect 3D unison with their anatomy
A neurosurgeon in the US has used augmented reality to overlay scans onto live images during brain surgery
Greg Blackman investigates some of the areas where machine vision is used in automotive manufacture
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
