The uEye Camera Manager from IDS Imaging Development Systems eases plug-and-play setup for Ethernet cameras.
Products and Press Releases
Docter Optics has introduced the Stilar 2.8/8, a super-wide-angle C-mount lens designed especially for use with 1.2-inch sensors and the Auto-Tessar series provides reflection-free images from 1.2-, 1/2-, and 1/3-inch sensors.
Vision Components has introduced the new VC4067 EXview smart camera, which is based on a Sony EXview HAD CCD sensor and is suitable for applications that require high light sensitivity.
Firstsight Vision is now shipping the latest release of Common Vision Blox (CVB), the versatile hardware-independent imaging toolkit from Stemmer Imaging.
The PLN2xCY, PLN4xCY and PLN20xCY objectives feature built-in neutral-density (ND) filters, enabling quick changes in magnification without the need to adjust light intensity.
The FireSync toolkit from LMI Technologies includes hardware and software to quickly build complex vision systems, providing high performance, multi-channel video processing and precise microsecond time synchronisation.
The Value Engineering Alliance (VEA) has released the EASY (Embedded Application SYstem), an industrial computer and machine vision platform.
The OmniView system from Cognex uses four cameras to obtain a seamless view of all the features on cylindrical surfaces.
Leutron Vision's PicSight cameras, with their USB 2.0 interface, are suited to the lower- to middle-performance demands of the industrial image processing market.
Firstsight Vision now offers four new digital progressive scan CCD cameras from JAI, offering nearly twice the frame rate compared to many models on the market, yet maintaining full resolution and high image quality.
The ThermaCam T-Series from Flir is compact, lightweight thermal camera for mid-range viewing, with a resolution of 320 x 240 pixels.
Open eVision 1.0 from Euresys is a new suite of reliable, powerful and flexible software tools dedicated to image processing and analysis.
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Events
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A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
