JAI has expanded its Go-X series of machine vision cameras to include 24 new global shutter camera models featuring the latest Sony Pregius S CMOS sensors
Products and Press Releases
SVS-Vistek has introduced its Beyond Visible line of expanded wavelength cameras
Ximea has introduced new models in its XiX cameras, which use Sony medium-format BSI sensors with exceptionally high resolution
AMD has announced the Ryzen Embedded R2000 series, mid-range system-on-chip (SoC) processors optimised for a wide range of industrial and robotics systems, machine vision and IoT
Orbbec has begun shipping its line of Femto time-of-flight 3D cameras
Visionary.ai is working with Innoviz lidar sensors to develop solutions to improve 3D machine vision for applications including robotics, smart cities, and drones
The Mikrotron EoSens Creation 2.0CXP2 camera allows engineers to embed custom image processing algorithms into its programmable Xilinx Kintex UltraScale FPGA
Micro-Epsilon has developed a new software tool, 3DInspect, which enables 3D data capture and evaluation
Vision Components has integrated four new Sony Pregius S sensors into Mipi camera modules for embedded vision
Framos has launched the FSM-IMX547 camera accessory for the Kria KR260 robotics starter kit from AMD
Lucid Vision Labs has announced that the high-resolution 47 MP Atlas10 camera has entered series production
Basler has introduced Pylon 7 software. The company is also now at Elite level in the Nvidia Partner Network
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Latest issue
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology