The highlight will be the FPGA-based hardware accelerator VC Power SoM, which completes complex image processing calculations
Products and Press Releases
More than 35 experienced application engineers are now available to provide support to the firm's customers
Photonis has broadened its MicroCube range with a small VGA resolution uncooled LWIR camera
The sensor offers high dynamic range, high-speed, high sensitivity and low noise
The Phoenix HDR ISP can deliver fully-tone mapped HDR video up to 120dB dynamic range even in high contrast lighting condition
The lens enables a nuclear fuel assembly to be viewed 13m away from the lens and through 10m of water
The firm will also be providing live demos of its C-Red 2 Lite system at Booth 349
Allied Vision has integrated Sony’s 4th generation 5.1 Megapixel IMX548 global shutter sensor, with Pregius S Sensor Technology, into its Alvium camera portfolio
With the Framegrabber SDK 5.10 release Basler provides a unified support for all Basler frame grabbers
The highlight will be the FPGA-based hardware accelerator VC Power SoM, which completes complex image processing calculations and transfers the results directly to a processor board
The 25GigE Hermes PH-25-QUAD and 10GigE Theia PT-10-QUAD network interface cards enable customers to get the most out of their ultra-high-speed cameras for a wide range of applications
AMD's adaptive computing technology is powering mobility supplier Denso Corporation’s next-generation lidar platform
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Latest issue
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology