Edmund Optics has released the Telecentric Backlight Illuminator, combining the advantages of backlighting an object with the benefits of a telecentric lens design.
Products and Press Releases
JAI has introduced a 5 Megapixel camera with GigE Vision digital interface as part of the Basic tier of the company's three-tier C3 Camera Suite.
Instrument Systems has launched the LumiCam 1300, with integrated LumiCam Software 4.0, for fast and reliable measurement display in the field of production.
A number of new variants have been added to the uEye Gigabit Ethernet cameras from IDS, available from Firstsight Vision.
Alrad Imaging has introduced the VDS Vosskuhler NIR-300, an infrared camera with a spectral range of 0.9–1.7µm. The digital camera incorporates a 320 x 256 InGaAs sensor with a 14-bit readout at 50fps.
Andor Technology has introduced a set of optimised drivers for Luca R and Luca S imaging EMCCD cameras within the Meta imaging series of acquisition and analysis software.
Point Grey Research has launched the Chameleon line of USB 2.0 digital cameras, generating high quality 1296(W) x 964(H) monochrome or raw Bayer colour images at 18fps.
Matrox Imaging Library (MIL) 9.0 features several enhancements to the image processing platform. MIL 9.0 takes advantage of today's high-performance graphics processor units (GPUs) and high-performance computing (HPC) clusters.
Matrox Imaging's Iris E-Series with Design Assistant is a powerful smart camera/software package. In the Matrox Design Assistant environment, users create a flow chart of the application that instructs the Matrox Iris E-Series camera.
Basler has released the first Linux version of its Pylon Driver. This driver package is designed to operate with all Basler GigE Vision cameras.
Kappa has released the Kalypso 023-USB CMOS camera series. The camera features an Aptina sensor, rugged construction and high signal quality.
Matrox Imaging has introduced the Matrox Morphis Evo, a video capture card with real-time multi-channel H.264 encoding.
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Events
Latest issue
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
