Princeton Instruments' MegaPlus EP16000 camera is now available with GigE Vision interface. The camera models of the MegaPlus series are ideal for medical imaging.
Products and Press Releases
Basler has expanded its Scout series with four new camera models based on Sony's high sensitivity ICX445 CCD sensor. Customers can choose from 11 CCD and one CMOS imaging sensor.
Basler has introduced new members of the Sprint and Runner line scan camera families.
The Iport NTx-Mini in-camera IP Engine, from Multipix Imaging, provides a flexible and cost-effective way for camera companies to integrate Gigabit Ethernet (GigE) connectivity into almost any industrial camera.
Toshiba Teli's CSL8000CL camera model is a 12K pixel resolution, high-speed line scan camera that can be commissioned to digitally output both 8-bit colour and 8-bit/10-bit monochrome images simultaneously.
Andor Technology has launched the latest version of EMCAL, a software method of EM (Electron Multiplying) gain self-recalibration for its iXonEM+ range of cameras.
Stemmer Imaging has launched version 10 of the Common Vision Blox (CVB) programming library, which includes support for Microsoft Windows Vista and a highly optimised installation routine.
Applied Image, based in Rochester, New York, has launched three analytical software programs from the providers of image quality measurement software, Imatest: Studio 3.0, Master 3.0 and API 3.0.
Kappa has released a range of cooled cameras with controlled double stage Peltier cooling. The cameras offer high performance for low light applications with long exposure times.
The Moritex MLNL series of LED line illuminators have been designed to meet the requirements for high performance linear lighting or for single dimensional linear CCD camera lighting.
The Basler Runner GigE Vision colour line scan camera has displayed high performance capabilities while running at slow speeds.
Firstsight Vision has introduced a colour version of the iNspect software package for the IPD VA series of compact machine vision solutions.
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A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
