Technology

Images taken with STMicroelectronics' 940nm NIR Quantum Film sensor (top left) and with its 1,400nm SWIR QF sensor (bottom left). Corresponding images taken using a visible smartphone camera (right). The QF NIR image shows better contrast between black electrical wires hidden in the dark green leaves, and tree trunks and branches hidden in front of the dark wood fence. The SWIR QF image shows how effective it is to use SWIR imaging to see through a silicon wafer. Credit: STMicroelectronics

ST's quantum dot sensor set for volume SWIR imaging

STMicroelectronics presented a quantum dot shortwave infrared sensor, with a 1.62µm pixel pitch and QE of 60 per cent, at the International Electronic Devices Meeting

The Austrian Institute of Technology's 3D surface scanner. Credit: AIT Austrian Institute of Technology

Four firms make Vision Award shortlist

The Austrian Institute of Technology, HD Vision Systems, Prophesee and Zeiss have been recognised by the judges, with the award to be presented at Vision in Stuttgart

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