Industry

Zeiss acquires metrology firm Gom

Gom’s technology, which includes non-contact 3D sensors and scanners for surface metrology, will now be part of Zeiss’s industrial metrology and quality assurance portfolio

AIA elects new board members

David Dechow (pictured), Edward Roney, Ghislain Beaupré, and Jeremy Bergh have been elected to serve two-year terms on the board of directors of AIA, the Association for Advancing Vision and Imaging

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