Neural classification
31 July 2018
Greg Blackman on the deep learning software tools now being deployed in industrial imaging
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
August/September 2018
Seeing beneath the surface
31 July 2018
Matthew Dale discovers that polarised imaging could soon see a surge in uptake in industrial inspection, thanks to a new sensor from Sony
Body image
31 July 2018
Keely Portway looks at some of the miniature imaging technology used in endoscopes
Foundation built on FPGAs
31 July 2018
Active Silicon turns 30 in September. Greg Blackman speaks to founder Colin Pearce (below) on building the company and the importance of FPGA technology
Damir Dolar
31 July 2018
Damir Dolar, managing director of Croatian firm Smartek Vision, spoke at the European Machine Vision Association’s business conference in Dubrovnik, Croatia, in June. Here, he gives his view on the European industrial imaging market
Imaging simplifies road lighting inspection
18 July 2018
Dr Constantinos Bouroussis, a tunnel lighting expert and a research associate at the National Technical University of Athens’ Lighting Laboratory, describes a mobile imaging system developed to inspect tunnel and road lighting
Best of bin picking at Automatica
22 June 2018
Robot bin picking has been worked on for a number of years, and while it has been shown to be possible it’s only now that the technology is coming to fruition. Greg Blackman looks at what was on display at Automatica
Events
Latest issue
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
