Greg Blackman visited the Embedded World conference and exhibition in Nuremberg, Germany, at the end of February to find vision in abundance
Abigail Williams finds that 3D scanning systems that can pinpoint dents and imperfections on aircraft body panels are being welcomed by aviation businesses to replace manual inspection
Matthew Dale explores new algorithms, processing boards and interfaces for viewing images, all for improving airborne surveillance
Anne Wendel, director of VDMA Machine Vision, reports from the joint VDMA and Vision CEO roundtable event at the beginning of February
Migrating software code from a PC to an embedded system to run vision applications presents various challenges. Following a presentation he gave at Embedded World in Nuremberg, Germany last week, Frank Karstens, field application engineer at Basler, gives his advice on the task
Ahead of his presentation at the Embedded World conference in Nuremberg, Germany on 28 February, Adam Taylor from Adiuvo Engineering and Training specifies what engineers need to consider when building an embedded infrared vision system for IoT and IIoT
A glass inspection system must distinguish between flawless and waste products to achieve automotive glass wafers free of optical distortions
Susan Fourtané on the increasing demands being placed on web inspection solutions to achieve zero-defect manufacturing
Automation is the only way for e-commerce and logistics firms to fulfil orders since the dramatic uptick in online shopping brought about by the Covid-19 pandemic
Facing new pressures and demands, logistics operations are calling for adaptable machine vision solutions to drive efficiency, discovers Benjamin Skuse
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Luca Verre, Co-founder and CEO of Prophesee, as well as a Photonics100 honoree, highlights how event-based vision is set to revolutionise mobile photography
Left: A semiconductor wafer shown to be opaque to white visible light. Right: the wafer is mostly transparent to SWIR light at a wavelength of 1,200nm, making it a suitable wavelength for semiconductor inspection.
Hunting defects in the soon-to-be trillion-dollar semiconductor industry is big business. Anita Chandran explores the latest wafer inspection technology
