nSPEC optical semiconductor analysis system
11 May 2011
Nanotronics Imaging has introduced the nSPEC optical semiconductor analysis system. The automatic optical inspection system is designed for analysing transparent and semi-transparent wafers for defects.
The software and hardware underlying nSPEC enables rapid, and detailed analysis of wafer defects. Complete system automation with cassette-to-cassette loading of 2-8 inch wafers is available. Nanotronics promotes 'point and shoot' microscopy, which provides accurate and easy to interpret data.